Genetic variation and inheritance of Tainan-white maize inbred lines resistance to the Asian corn borer (Ostrinia furnacalis).
The S2 and S5 inbred lines derived from eight Tainan-white (TNW) maize populations collected from eight differential areas were evaluated for resistance to Asian corn borer (Ostrinia furnacalis), at Wufeng, Taichung. Artificial infestation of the larvae on plant was used in whorl and silking stages of plant development, respectively. The result indicated that the TNW inbred lines with larger genetic variation for Asian corn borer feeding damage in the whorl and silking stages of plant development can be selected for higher resistance. In the diallel cross using Haymans method for analysis, the result indicated that the variation attributed to additive gene and non-additive gene were highly significantly for Asian corn borer resistance in whorl stage and silking stage. The additive genetic variance was larger than the non-additive genetic variance. The resistance to Asian corn borer was controlled by 2 and 3 groups of gene in whorl and silking stage of plant development, respectively. The recessive gene might be the one attributing resistance to Asian corn borer because the inbred lines with higher level of resistance have more recessive genes.